Compositional System Level Reliability Analysis in the Presence of Uncertainties
Ever shrinking device structures are one of the main reasons for a growing inherent unreliability of embedded system components.
The small device structures are susceptible to, e.g., environmental changes like cosmic rays or to manufacturing tolerances.
These so-called uncertainties are due to changes and can only be approximated or estimated at design time.
The ultimate goal of this project is the investigation and development of a methodology for system-level reliability analysis
and design of reliable systems through means of self-adaptation and error-resiliency.
This project focuses on (a) the development of suitable cross-level reliability analysis techniques that combine various reliability
analysis techniques across different levels of abstraction, (b) enrich well-known reliability analysis techniques by the ability
to consider and explicitly model uncertainties, and (c) integrate such a compositional analysis into a system-level design space
exploration to allow for cost evaluation of reliability-increasing techniques.
Supported by the German Research Foundation (DFG) in project under contract GL 819/1-2 and TE 163/16-2.
This project is associated with the DFG Priority Programm SPP 1500.
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