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CRAU
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CRAU

Compositional System Level Reliability Analysis in the Presence of Uncertainties

Ever shrinking device structures are one of the main reasons for a growing inherent unreliability of embedded system components. The small device structures are susceptible to, e.g., environmental changes like cosmic rays or to manufacturing tolerances. These so-called uncertainties are due to changes and can only be approximated or estimated at design time. The ultimate goal of this project is the investigation and development of a methodology for system-level reliability analysis and design of reliable systems through means of self-adaptation and error-resiliency. This project focuses on (a) the development of suitable cross-level reliability analysis techniques that combine various reliability analysis techniques across different levels of abstraction, (b) enrich well-known reliability analysis techniques by the ability to consider and explicitly model uncertainties, and (c) integrate such a compositional analysis into a system-level design space exploration to allow for cost evaluation of reliability-increasing techniques.

Supported by the German Research Foundation (DFG) in project under contract GL 819/1-2 and TE 163/16-2.
This project is associated with the DFG Priority Programm SPP 1500.

CRAU: Compositional System Level Reliability Analysis in the Presence of Uncertainties

Publications

2017
18 H. Aliee, E. Borgonovo, M. Glaß and J. Teich.
On the Boolean Extension of the Birnbaum Importance to Non-Coherent Systems.
In J. Reliability Engineering & System Safety, vol. 160,pp. 191-200, 2017. ©1
[doi>10.1016/j.ress.2016.12.013]
17 H. Aliee, A. Banaiyianmofrad, M. Glaß, J. Teich and N. Dutt.
Redundancy-aware Design Space Exploration for Memory Reliability in Many-cores.
In Proc. Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV'17), February 8-9, Bremen, Germany, pp. 1-12, 2017. ISBN 978-3-8440-4996-1. ©1
16 F. Khosravi, M. Glaß and J. Teich.
Automatic Reliability Analysis in the Presence of Probabilistic Common Cause Failures.
To appear in IEEE Transactions on Reliability, 2017. ©1
[doi>10.1109/TR.2016.2638320]
2016
15 H. Aliee, S. Vitzethum, M. Glaß, J. Teich and E. Borgonovo.
Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems.
In Proceedings 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, September 19-20, pp. 53-56, 2016. ©1
[doi>10.1109/DFT.2016.7684069]
14 E. Borgonovo, H. Aliee, M. Glaß and J. Teich.
A New Time-Independent Reliability Importance Measure.
In European Journal of Operational Research (EJOR), vol. 254, no. 2, p. 427-442, 2016. ©1
[doi>10.1016/j.ejor.2016.03.054]
2015
13 H. Aliee, E. Borgonovo, M. Glaß and J. Teich.
Importance Measures in Time-dependent Reliability Analysis and System Design.
In Proceedings of the Annual European Safety and Reliability Conference (ESREL '15), Zurich, Switzerland, September 7-10, 2015. ©1
12 M. Glaß, H. Aliee, L. Cheng, M. Ebrahimi, F. Khosravi, V. Kleeberger, A. Listl, D. Müller-Gritschneider, F. Oboril, U. Schlichtmann, M. Tahoori, J. Teich, N. Wehn and C. Weis.
Application-aware cross-layer reliability analysis and optimization.
it - Information Technology, Volume 57(3): 159-169, 2015. ©1
[doi>10.1515/itit-2014-1080]
11 F. Khosravi, M. Müller, M. Glaß and J. Teich.
Uncertainty-Aware Reliability Analysis and Optimization.
In Proceedings of Design, Automation and Test in Europe (DATE 2015), pp. 97-102, Grenoble, France, March 9-13, 2015. ©1
[doi>10.7873/DATE.2015.0319]
2014
10 H. Aliee, M. Glaß, F. Khosravi and J. Teich.
An Efficient Technique for Computing Importance Measures in Automatic Design of Dependable Embedded Systems.
In Proceedings of the International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS 2014), pp. 34:1-34:10, New Delhi, India, October 12-17, 2014. ©1
[doi>10.1145/2656075.2656079]
9 F. Khosravi, F. Reimann, M. Glaß and J. Teich.
Multi-Objective Local-Search Optimization using Reliability Importance Measuring.
In Proceedings of the 51st Design Automation Conference (DAC 2014), pp. 1-6, San Francisco, CA, USA, June 1-5, 2014. ©1
[doi>10.1145/2593069.2593164]
8 U. Schlichtmann, V. Kleeberger, J. Abraham, A. Evans, C. Gimmler-Dimont, M. Glaß, A. Herkersdorf, S. Nassif and N. Wehn.
Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test .
In Proceedings of Design, Automation and Test in Europe (DATE 2014), 8 p., Dresden, Germany, March 24-28, 2014. ©1
[doi>10.7873/DATE.2014.265]
7 A. Herkersdorf, H. Aliee, M. Engel, M. Glaß, C. Gimmler-Dimont, J. Henkel, V. Kleeberger, M. Kochte, J. Kühn, D. Mueller-Gritschneider, S. Nassif, H. Rauchfuß, W. Rosenstiel, U. Schlichtmann, M. Shafique, M. Tahoori, J. Teich, N. Wehn, C. Weis and H. Wunderlich.
Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-Chip Resilience.
In Microelectronics Reliability, Volume 54(6–7): 1066-1074, June-July, Elsevier, ISSN 0026-2714, 2014. ©1
[doi>10.1016/j.microrel.2013.12.012]
6 H. Aliee, M. Glaß, R. Wanka and J. Teich.
Automatic Graph-based Success Tree Construction and Analysis.
In Proceedings of the 60th Annual Reliability and Maintainability Symposium (RAMS 2014), pp. 563-569, Colorado Springs, U.S.A., January 27-30, 2014. (Best Paper Award). ©1
[doi>10.1109/RAMS.2014.6798487]
2013
5 A. Herkersdorf, M. Engel, M. Glaß, J. Henkel, V. Kleeberger, M. Kochte, J. Kühn, S. Nassif, H. Rauchfuss, W. Rosenstiel, U. Schlichtmann, M. Shafique, M. Tahoori, J. Teich, N. Wehn, C. Weis and H. Wunderlich.
Cross-Layer Dependability Modeling and Abstraction in System on Chip.
In Proceedings of the 9th Workshop on Silicon Errors in Logic - System Effects (SELSE), Stanford University, U.S.A., Mar. 26-27, 2013. ©1
4 H. Aliee, M. Glaß, F. Reimann and J. Teich.
Automatic Success Tree-Based Reliability Analysis for the Consideration of Transient and Permanent Faults.
In Proceedings of Design, Automation and Test in Europe (DATE 2013), pp. 1621-1626, Grenoble, France, Mar. 18-22, 2013. ©3
[doi>10.7873/DATE.2013.329]
2012
3 M. Glaß, H. Yu, F. Reimann and J. Teich.
Cross-Level Compositional Reliability Analysis for Embedded Systems.
In Proceedings of the 31th International Conference on Computer Safety, Reliability and Security (SAFECOMP 2012), pp. 111-124, Magdeburg, Germany, September 25-28, 2012. ©1
[doi>10.1007/978-3-642-33678-2_10]
2011
2 J. Angermeier, D. Ziener, M. Glaß and J. Teich.
Runtime Stress-Aware Replica Placement on Reconfigurable Devices under Safety Constraints.
Proceedings of the International Conference on Field-Programmable Technology (FPT'11), pp. 1-6, New Delhi, India. Dec. 12-14, 2011. ©1
[doi>10.1109/FPT.2011.6133247]
1 J. Angermeier, D. Ziener, M. Glaß and J. Teich.
Stress-Aware Module Placement on Reconfigurable Devices.
Proceedings of the Conference on Field-Programmable Logic and Applications (FPL 2011), pp. 277-281, Chania, Crete, Greece. Sep 5-7. 2011. ©1

Misc.

2014
5 H. Aliee, L. Chen, M. Ebrahimi, M. Glaß, F. Khosravi and M. Tahoori.
Towards Cross-layer Reliability Analysis of Transient and Permanent Faults.
In Proceedings of the Racing Workshop, Germany, June, 2014. ©1
2013
4 M. Glaß, H. Aliee, F. Reimann and J. Teich.
Concurrent Consideration of Transient and Permanent Faults using Success Trees.
Talk at the Workshop on Compiler Assisted SoC Assembly (CASA), in conjunction with ESWEEK, Montreal, Canada, October 3rd, 2013. ©1
2012
3 M. Glaß.
Considering Software-based Redundancy during the Design of Reliable Embedded Systems.
Talk at the 44. Diskussionkreis Fehlertoleranz, Nuremberg, Germany, November 22, 2012. ©1
2 M. Glaß, H. Yu, F. Reimann, H. Aliee and J. Teich.
A Concept for Cross-Level Compositional Reliability Analysis in the Presence of Uncertainty.
International Workshop on Hardware/Software Techniques for Cross-Layer Resiliency at ICCAD '12, San Jose, U.S.A., November 08, 2012. ©1
1 M. Glaß.
Not yet Hardware, not yet Software - Setting the Course for Dependable Systems in Early Design Phases.
Keynote at the 1st Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '12) in conjunction with GMDS / Informatik 2012, Brunswick, Germany, September 19, 2012. ©1
  Impressum Stand: 25 September 2014.   M.G.